Inheritance and Molecular Tagging of Resistance against Verticillium Wilt in Upland Cotton

GE Hai-Yan, WANG Ye-Chun, GUO Wang-Zhen, ZHANG Tian-Zhen

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Cotton Science ›› 2008, Vol. 20 ›› Issue (1) : 19-22. DOI: 10.11963/cs080104
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Inheritance and Molecular Tagging of Resistance against Verticillium Wilt in Upland Cotton

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2008, 20(1): 19-22. https://doi.org/10.11963/cs080104

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ISSN 1002-7807　CN 41-1163/S
Superintendent: China Association for Science and Technology
Sponsored by: China Association of Agricultural Science Societies
Organized by: Institute of Cotton Research of CAAS
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