棉 花 学 报    Cotton Science   2010，22（3）：273~278

Progresses on QTL Mapping for Cotton Resistant to Verticillium Wilt
FENG Chang-hui¹, ZHANG Sheng-xi^1*, SHI Ren-hui², FU Li-li³, BAI Jing², CHEN Yin-hua⁴
(1.Institute of Industrial Crops, Hubei Academy of Agricultural Sciences,Wuhan, Hubei 430064，China；2. National Key Laboratory of Crop Genetic Improvement,Huazhong Agricultural University, Wuhan, Hubei 430070, China; 3. Institute of Tropical Biotechnology and Bioscience, Chinese Academy of Tropical Agricultural Sciences, Haikou, Hainan 571101, China; 4. Cotton Research Institute, Chinese Academy of Agricultural Sciences, Anyang, Henan 455000, China)

Abstract: The development of QTL mapping make it easy to dissect the genetic basis of quantitative traits into Mendelian factors, and the genetic basis of quantitative traits could be better understood. So the technique could lay a foundation for the acceleration of improvement on cotton resistant to Verticillium wilt through molecular breeding.In the light of problems as encountered in QTL mapping for cotton resistant to Verticillium wilt, we made a detailed review that focused on the theory,progresses on QTL mapping for cotton resistant to Verticillium wilt. The application of QTL mapping for cotton resistant to Verticillium wilt to genetic improvement in the future was discussed also in this paper.
Key words: cotton;QTL mapping; Verticillium wilt; molecular marker    [Full Text, 477KB]