棉 花 学 报     Cotton Science    2008 ， 20(1) ： 19-22

Inheritance and Molecular Tagging of Resistance against Verticillium Wilt in Upland Cotton
GE Hai-yan，WANG Ye-chun，GUO Wang-zhen，ZHANG Tian-zhen^*
(State Key Laboratory of Crop Genetics & Germplasm Enhancement，Nanjing Agricultural University，Nanjing 210095，China)

Abstract：Molecular marker-assisted selection was effective to quickly breeding cultivars resistant to Verticillium wilt. In this research, the upland cotton strain Chang 96, which is resistant against Verticillium wilt, and the susceptible variety, Junmian 1, were used as experimental materials, a tagging population with 138 F₂ individual plants was developed. By artificially inoculating the strongly pathogenic fungi strain to the populations P₁, P₂, F₁, F_2:3, the relative disease indexes of each generation was estimated. Using the method of the major gene plus polygene mixed genetic model analysis between major gene and multiple genes, the optimum genetic model of that combination was discovered to be C-0 model, i.e., the multiple gene model among additive-dominant-epistatic genes. A total of 1998 pairs of SSR primers, and 230 pairs of SRAP primers were screened, 148 SSR and 6 SRAP polymorphism marker loci were obtained. Furthermore, by utilizing Mapmaker software, a genetic linkage map based on intraspecific F₂ populations with 122 marker loci was constructed. According to the composite interval principle to scan total cotton genome by Mapmaker/QTL program, one resistance QTL was detected and localized on chromosome nine between the interval of the NAU462 and JESPR114, 13.8% phenotypic variance in F_2:3 of which might be explained.
Key word：cotton; Verticillium wilt; inherence; QTL mapping        [Full Text, 1749KB]